Statistical Modeling of ICP-OES Interferences for Platinum Analysis
Tim Zembryski. Sabin Metal Corporation
SAC
PRECIOUS METAL DISSOLUTION CHALLENGES AND MICROWAVE DIGESTION
Eric Farrell. Milestone
Interference Removal-Mitigation Utilizing ICP-MS-MS and Single Unit Mass Resolution
Craig Jones, ICP-MS, ICP-MS/MS Application Scientist. Agilent Technologies
Electronic Scrap Analysis
Electronic Scrap Analysis. Review of ISO 17025 Method for the Analysis of Electronic Scrap. James Han, Lab/Technical Director - Ledoux
Development of Primary Certified Reference Materials - Madeline Gozzi
Development of Primary Certified Reference Materials (PCRM™)
Primary SI Traceable Solution Standards For Iridium and Osmium
Madeline Gozzi, R&D Chemist
The Benefits and Challenges of 3rd Party Supervision During the Sampling of Precious Metals
“The Benefits and Challenges of 3rd Party Supervision During the Sampling of Precious Metals” Nelson Castellanos, Bureau Veritas