Statistical Modeling of ICP-OES Interferences for Platinum Analysis
Tim Zembryski. Sabin Metal Corporation
Tim Zembryski. Sabin Metal Corporation
Eric Farrell. Milestone
Craig Jones, ICP-MS, ICP-MS/MS Application Scientist. Agilent Technologies
Electronic Scrap Analysis. Review of ISO 17025 Method for the Analysis of Electronic Scrap. James Han, Lab/Technical Director - Ledoux
Development of Primary Certified Reference Materials (PCRM™)
Primary SI Traceable Solution Standards For Iridium and Osmium
Madeline Gozzi, R&D Chemist
by Wilma Swarts, Metals Focus & Women in PGMs
IPMI Preventing Autocat Theft (PACT) Roundtable
by Heather Wood, PGM of Texas